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Equipements électroniques de bureau

Temps Différé OTC Markets 17:09:12 31/08/2026			Varia. 5j.	Varia. 1 janv.
44,22 ^USD	-19,40%		-.--%	+36,20%

05/10	JEOL Ltd. développe un nouveau microscope électronique à balayage avec usinage ionique à faible angle, HAXIS, et lance sa commercialisation	CI
28/09	JEOL Ltd. : SBI Securities de acheteur à neutre sur le titre	ZM

Communiqués

09/10	JEOL : Congratulations to Professor Emeritus Kenso Soai on Receiving the Nobel Prize in Chemistry	PU
05/10	JEOL: Sales launch of HAXIS: The New Low-angle Ion Milling Scanning Electron Microscope	BU
02/10	JEOL : Research results from a collaborative research group led by Sejong University, with participation from JEOL Ltd., on the development of organic electrode materials for sodium-ion batteries have been published in "Advanced Energy Materials"	PU
30/09	JEOL : Research results from a collaborative research group led by Sejong University, with participation from JEOL Ltd., on the development of cathode materials for sodium-ion batteries have been published in "eScience"	PU
29/09	JEOL : Our collaborative research with the Indian Institute of Science Education and Research (IISER) Kolkata, JEOL Ltd., and Rigaku Asia Pacific Pte. Ltd. has been published in the" Journal of the American Chemical Society"	PU
09/09	JEOL : Our research paper has been published in "Chemical Communications" through collaboration between Tokushima University, Kanazawa University and JEOL Ltd.	PU
08/09	JEOL : Our research paper has been published in "Advanced Materials" through collaboration between A*STAR, Nanyang Technological University, JEOL Ltd., and Kyoto University	PU
02/09	JEOL : Hydrocarbon Analysis Solutions with JMS-T2000GC AccuTOF™ GC-Alpha 2.0	PU
01/09	JEOL: Launch of the New Benchtop Scanning Electron Microscope “JCM-7000Plus NeoScope™”	BU
28/08	JEOL : A collaborative research team led by Hanyang University, with participation from JEOL, has published its findings in "Advanced Functional Materials"	PU
28/08	JEOL : Symmetry evaluation of vacancy structure in silicon single crystal	PU
21/08	JEOL : Looking beyond the practical application - The frontline and challenges of all-solid-state batteries	PU
21/08	JEOL : A collaborative research project between University of California, Riverside, National Institute for Materials Science (NIMS), Shinshu University, University of Tsukuba, and JEOL Ltd. has been published in Angewandte Chemie International Edition.	PU
20/08	JEOL : Life Science Note	PU
12/08	JEOL : Our joint paper has been published in "Chemical & Pharmaceutical Bulletin"	PU
07/08	JEOL : Joint research by Shimane University, JEOL Ltd., and collaborators has been published in “Acta Materialia”	PU
04/08	Evaluation of Oblique Light-Induced Degradation of Indoor Line Tape by Mass Spectrometry (3): Differential Analysis of Migrated Components from Floor Surfaces Using TD–GC/MS [Application Notes]	PU
03/08	JEOL : Launch of the New 300 kV Atomic Resolution Analytical Microscope "GRAND ARM™ 3"	PU
24/07	Evaluation of Oblique Light-Induced Degradation of Indoor Line Tape by Mass Spectrometry (2): Qualitative Analysis of Orange Pigment Components [Application Notes]	PU
22/07	JEOL : Analysis of organic material using SEM-EDS-Raman	PU
21/07	Evaluation of Oblique Light-Induced Degradation of Indoor Line Tape by Mass Spectrometry (1): Qualitative Analysis of Tape Substrate and Adhesive [Application Notes]	PU
09/07	JEOL : High-resolution observation of pigments using a liquid-cell holder	PU
08/07	JEOL : Making MicroED, the Ultimate Tool for Crystal Structure Determination, Easier to Use!	PU
02/07	JEOL : High‑Resolution Analysis of Carbon–Fluorine Couplings	PU
29/06	University of Queensland, CMM: Centre for Microscopy and Microanalysis [Selected list of installations]	PU